Cover Image

Two- and three-dimensional methods for inspection and metrology III : 24-26 October 2005, Boston, Massachusetts, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 6000.
Subjects:
Computer vision > Congresses.
Imaging systems > Congresses.
Three-dimensional display systems > Congresses.
Quality control > Optical methods > Congresses.
Optical measurements > Congresses.
Metrology > Congresses.

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Holdings details from Remote Storage
Call Number: TA1634 .T96 2005
 
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TA1634 .T96 2005 Available