Society of Photo-optical Instrumentation Engineers & Harding, K. G. (2005). Two- and three-dimensional methods for inspection and metrology III: 24-26 October 2005, Boston, Massachusetts, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Kevin G. Harding. Two- and Three-dimensional Methods for Inspection and Metrology III: 24-26 October 2005, Boston, Massachusetts, USA. Bellingham, Washington: SPIE, 2005.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Kevin G. Harding. Two- and Three-dimensional Methods for Inspection and Metrology III: 24-26 October 2005, Boston, Massachusetts, USA. SPIE, 2005.
Warning: These citations may not always be 100% accurate.