Introduction to advanced system-on-chip test design and optimization /
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Dordrecht ; New York :
Springer,
2005.
|
| Series: | Frontiers in electronic testing ;
29. |
| Subjects: |
Remote Storage
| Call Number: |
TK7895.E42 L37 2005 |
|
|---|---|---|
| Call Number | Status | Get It |
| TK7895.E42 L37 2005 | Available | |