Introduction to advanced system-on-chip test design and optimization /

Bibliographic Details
Main Author: Larsson, Erik, 1966-
Format: Book
Language:English
Published: Dordrecht ; New York : Springer, 2005.
Series:Frontiers in electronic testing ; 29.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TK7895.E42 L37 2005
 
Call Number Status Get It
TK7895.E42 L37 2005 Available