APA (7th ed.) Citation

Society of Photo-optical Instrumentation Engineers, SPIE Europe, Friedrich-Schiller-Universität Jena, European Optical Society, Deutsche Gesellschaft für Angewandte Optik, Optonet (Organization), . . . Wang, L. (2005). Optical fabrication, testing and metrology II: 13-15 September 2005, Jena, Germany. SPIE.

Chicago Style (17th ed.) Citation

Society of Photo-optical Instrumentation Engineers, SPIE Europe, Friedrich-Schiller-Universität Jena, European Optical Society, Deutsche Gesellschaft für Angewandte Optik, Optonet (Organization), Angela Duparré, Roland Geyl, and Lingli Wang. Optical Fabrication, Testing and Metrology II: 13-15 September 2005, Jena, Germany. Bellingham, Washington: SPIE, 2005.

MLA (9th ed.) Citation

Society of Photo-optical Instrumentation Engineers, et al. Optical Fabrication, Testing and Metrology II: 13-15 September 2005, Jena, Germany. SPIE, 2005.