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Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, SPIE Europe, Friedrich-Schiller-Universität Jena, European Optical Society, Deutsche Gesellschaft für Angewandte Optik, Optonet (Organization)
Other Authors: Duparré, Angela, Geyl, Roland, Wang, Lingli
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5965.
Subjects:
Optical instruments > Design and construction > Congresses.
Optical instruments > Testing > Congresses.
Optical materials > Congresses.
Metrology > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5965.toc
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https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5965.toc

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Call Number: TS510 .O592 2005
 
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TS510 .O592 2005 Available
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