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Semiconductor material and device characterization /

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Bibliographic Details
Main Author: Schroder, Dieter K.
Format: Book
Language:English
Published: [Piscataway, N.J.] : Hoboken, N.J. : IEEE Press ; Wiley, [2006]
Edition:3rd ed.
Subjects:
Semiconductors.
Semiconductors > Testing.
Description
Item Description:"Wiley-Interscience."
Physical Description:xv, 779 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0471739065 (acid-free paper)