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Semiconductor material and device characterization /

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Bibliographic Details
Main Author: Schroder, Dieter K.
Format: Book
Language:English
Published: [Piscataway, N.J.] : Hoboken, N.J. : IEEE Press ; Wiley, [2006]
Edition:3rd ed.
Subjects:
Semiconductors.
Semiconductors > Testing.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QC611 .S335 2006
 
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QC611 .S335 2006 Available