Mathematical methods in pattern and image analysis : 3-4 August 2005, San Diego, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Astola, Jaakko, Tǎbuş, Ioan, Barrera, Júnior
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5916.
Subjects:	Image processing > Mathematics > Congresses. Image processing > Digital techniques > Congresses. Pattern recognition systems > Mathematics > Congresses. Nonlinear optics > Mathematics > Congresses. Neural networks (Computer science) > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5916.toc

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