Ultrafast x-ray detectors, high-speed imaging, and applications : 31 July-1 August and 4 August 2005, San Diego, California, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Conference on Ultrafast X-ray Detectors and Applications
Other Authors:	Kleinfelder, Stuart
Format:	Conference Proceeding Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5920.
Subjects:	X-ray optics > Congresses. Radiation sources > Congresses. Optical detectors > Congresses. Optical detectors > Industrial applications > Congresses. Photonics > Congresses. Photography, High-speed > Congresses.

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