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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Main Author: Egerton, R. F.
Format: Book
Language:English
Published: New York : Springer Science+Business Media, [2005]
Subjects:
Electron microscopy.
Description
Physical Description:xii, 202 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [195]-196) and index.
ISBN:0387258000 (hd.bd.)