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Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM /

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Bibliographic Details
Main Author: Egerton, R. F.
Format: Book
Language:English
Published: New York : Springer Science+Business Media, [2005]
Subjects:
Electron microscopy.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: QH212.E4 E39 2005
 
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QH212.E4 E39 2005 Available