Noise and information in nanoelectronics, sensors, and standards III : 24-26 May 2005, Austin, Texas, USA /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2005]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5846. |
| Subjects: |
| Physical Description: | xxiv, 210 pages : illustrations ; 28 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819458414 |