Noise and information in nanoelectronics, sensors, and standards III : 24-26 May 2005, Austin, Texas, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Bergou, János A.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5846.
Subjects:	Noise > Congresses. Noise control > Congresses. Nanotechnology > Congresses. Information technology > Congresses. Detectors > Congresses.

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