Tolerating failures of continuous-valued sensors /

Bibliographic Details
Main Author:	Marzullo, Keith
Corporate Author:	Ames Research Center
Format:	Government Document Book
Language:	English
Published:	Ithaca, N.Y. : [Moffett Field, Calif.] : Cornell University, Dept. of Computer Science ; [NASA Ames Research Center] ; [1990]
Series:	NASA contractor report ; NASA CR-187028.
Subjects:	Process control. Fault-tolerant computing. Computer programming. Computerized simulation. Distributed processng. Failure analysis. Fault tolerance. Process control (Industry)
Online Access:	https://purl.fdlp.gov/GPO/LPS63771

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