Cover Image

Nano- and micro-metrology : 16-17 June 2005, Munich, Germany /

Bibliographic Details
Corporate Authors: SPIE Europe, European Optical Society, Society of Photo-optical Instrumentation Engineers
Other Authors: Ottevaere, Heidi, DeWolf, Peter, Wiersma, Diedrick S.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5858.
Subjects:
Optical measurements > Congresses.
Metrology > Congresses.
Nanostructured materials > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5858.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5858.toc

Remote Storage

Holdings details from Remote Storage
Call Number: QC367 .N36 2005
 
Call Number Status Get It
QC367 .N36 2005 Available