Optical diagnostics : 3-4 August 2005, San Diego, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Hanssen, Leonard Matheus, 1953-
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5880.
Subjects:	Materials > Testing > Congresses. Materials > Optical properties > Congresses. Optical measurements > Congresses. Reflectance > Congresses. Refractive index > Congresses. Farrell, Patrick V.

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