Society of Photo-optical Instrumentation Engineers, Duparré, A., Singh, B., & Gu, Z. (2005). Advanced characterization techniques for optics, semiconductors, and nanotechnologies II: 2-4 August 2005, San Diego, California, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Angela Duparré, Bhanwar Singh, and Zu-Han Gu. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II: 2-4 August 2005, San Diego, California, USA. Bellingham, Washington: SPIE, 2005.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II: 2-4 August 2005, San Diego, California, USA. SPIE, 2005.
Warning: These citations may not always be 100% accurate.