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Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August 2005, San Diego, California, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Duparré, Angela, Singh, Bhanwar, Gu, Zu-Han
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5878.
Subjects:
Optical materials > Congresses.
Semiconductors > Characterization > Congresses.
Optoelectronics > Congresses.
Information storage and retrieval systems > Congresses.
Metrology > Congresses.
Optoelectronic devices > Congresses.
Optical measurements > Congresses.
Thin films > Optical properties > Congresses.
Nanotechnology > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5878.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5878.toc

Remote Storage

Holdings details from Remote Storage
Call Number: QC373 .A38 2005
 
Call Number Status Get It
QC373 .A38 2005 Available