Matching properties of deep sub-micron MOS transistors /

Bibliographic Details
Main Author: Croon, Jeroen A.
Other Authors: Sansen, Willy M. C., Maes, H. E. (Herman E.)
Format: Book
Language:English
Published: Norwell, MA : Springer, [2005]
Series:Kluwer international series in engineering and computer science. SECS 851.
Subjects: