Matching properties of deep sub-micron MOS transistors /

Bibliographic Details

Main Author:	Croon, Jeroen A.
Other Authors:	Sansen, Willy M. C., Maes, H. E. (Herman E.)
Format:	Book
Language:	English
Published:	Norwell, MA : Springer, [2005]
Series:	Kluwer international series in engineering and computer science. SECS 851.
Subjects:	Metal oxide semiconductor field-effect transistors.