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Matching properties of deep sub-micron MOS transistors /

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Bibliographic Details
Main Author: Croon, Jeroen A.
Other Authors: Sansen, Willy M. C., Maes, H. E. (Herman E.)
Format: Book
Language:English
Published: Norwell, MA : Springer, [2005]
Series:Kluwer international series in engineering and computer science. SECS 851.
Subjects:
Metal oxide semiconductor field-effect transistors.
Description
Physical Description:x, 206 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [193]-203).
ISBN:0387243143 (hd.bd.)
0387243135 (e-book)
ISSN:0893-3405 ;