CCD image sensors in deep-ultraviolet : degradation behavior and damage mechanisms /

Bibliographic Details
Main Author:	Li, F. M. (Flora M.)
Other Authors:	Nathan, Arokia, 1957-
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, 2005.
Series:	Microtechnology and MEMS.
Subjects:	Image processing > Digital techniques. Remote sensing. Service life (Engineering)

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