Introduction to the characterization of residual stress by neutron diffraction /

Bibliographic Details
Other Authors: Hutchings, Michael T.
Format: Book
Language:English
Published: Boca Raton, FL : Taylor & Francis, 2005.
Subjects:

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Holdings details from Remote Storage
Call Number: TA417.25 .I59 2005
 
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TA417.25 .I59 2005 Available