Society of Photo-optical Instrumentation Engineers & Geer, R. E. (2005). Testing, reliability, and application of micro- and nano-material systems III: 8-10 March 2005, San Diego, California, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Robert E. Geer. Testing, Reliability, and Application of Micro- and Nano-material Systems III: 8-10 March 2005, San Diego, California, USA. Bellingham, Washington: SPIE, 2005.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers and Robert E. Geer. Testing, Reliability, and Application of Micro- and Nano-material Systems III: 8-10 March 2005, San Diego, California, USA. SPIE, 2005.
Warning: These citations may not always be 100% accurate.