Testing, reliability, and application of micro- and nano-material systems III : 8-10 March 2005, San Diego, California, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Geer, Robert E.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5766.
Subjects:	Electrooptical devices > Materials > Testing > Congresses. Photonics > Materials > Testing > Congresses. Nanostructured materials > Testing > Congresses. Microelectromechanical systems > Testing > Congresses.

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