Cover Image

Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Price, Jeffery R. (Jeffery Ray), 1970-, Meriaudeau, Fabrice
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2005]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 5679.
Subjects:
Engineering inspection > Automation > Congresses.
Computer vision > Industrial applications > Congresses.
Quality control > Optical methods > Automation > Congresses.
Measurement > Congresses.
Description
Item Description:At head of title: Proceedings of Electronic Imaging Science and Technology.
Physical Description:viii, 302 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819456527