Machine vision applications in industrial inspection XIII : 17-18 January 2005, San Jose, California, USA /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Price, Jeffery R. (Jeffery Ray), 1970-, Meriaudeau, Fabrice
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5679.
Subjects:	Engineering inspection > Automation > Congresses. Computer vision > Industrial applications > Congresses. Quality control > Optical methods > Automation > Congresses. Measurement > Congresses.

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