Image processing and pattern recognition in remote sensing II : 8-9 November 2004, Honolulu, Hawaii, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, United States. National Aeronautics and Space Administration
Other Authors:	Yasuoka, Yoshifumi, Ungar, S. G.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2005]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5657.
Subjects:	Earth sciences > Remote sensing > Congresses. Remote sensing > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5657.toc

Evans: Library Stacks