Regular fabrics in deep sub-micron integrated-circuit design /

Regular Fabrics in Deep Sub-Micron Integrated-Circuit Design discusses new approaches to better timing-closure and manufacturability of DSM Integrated Circuits. The key idea presented is the use of regular circuit and interconnect structures such that area/delay can be predicted with high accuracy....

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Bibliographic Details
Main Author: Mo, Fan
Corporate Author: SpringerLink (Online service)
Other Authors: Brayton, Robert King
Format: eBook
Language:English
Published: Norwell, Mass. : Kluwer Academic Publishers, [2004]
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Call Number: TK7874 .M53223 2004eb
 
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TK7874 .M53223 2004eb Available