Error rate and power dissipation in nano-logic devices /
Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation cu...
| Main Author: | Kim, Jong Un |
|---|---|
| Format: | Thesis eBook |
| Language: | English |
| Published: |
[Place of publication not identified] :
[publisher not identified] ;
2004.
|
| Subjects: | |
| Online Access: | Link to OAK Trust copy |
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