Error rate and power dissipation in nano-logic devices /

Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation cu...

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Bibliographic Details

Main Author:	Kim, Jong Un
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2004.
Subjects:	Major electrical engineering.
Online Access:	Link to OAK Trust copy