Error rate and power dissipation in nano-logic devices /
Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation cu...
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| Format: | Thesis eBook |
| Language: | English |
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[Place of publication not identified] :
[publisher not identified] ;
2004.
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| Online Access: | Link to OAK Trust copy |
| Summary: | Current-controlled logic and single electron logic processors have been investigated with respect to thermal-induced bit error. A maximal error rate for both logic processors is regarded as one bit-error/year/chip. A maximal clock frequency and an information channel capacity at a given operation current are derived when a current-controlled logic processor works without error. An available operation range in a current-controlled processor with 10⁸ elements is discussed. The dependence of an error-free condition on temperature in single electron logic processors is derived. The size of the quantum dot of a single electron transistor is predicted when a single electron logic processor with the 10⁹ single electron transistors works without error at room temperature. |
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| Item Description: | Vita. "Major subject: Electrical Engineering". |
| Physical Description: | vi, 29 leaves : illustrations ; 28 cm. Also available online. Issued also on microfiche from Lange Micrographics. |
| Bibliography: | Includes bibliographical references (leaves 22-23). |