Radiation effects and soft errors in integrated circuits and electronic devices /

Bibliographic Details
Other Authors: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Format: Book
Language:English
Published: Singapore ; New Jersey : World Scientific Pub., [2004]
Series:Selected topics in electronics and systems ; vol. 34.
Subjects:
Description
Physical Description:viii, 339 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references.
ISBN:9812389407 (cased)