Radiation effects and soft errors in integrated circuits and electronic devices /

Bibliographic Details
Other Authors: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Format: Book
Language:English
Published: Singapore ; New Jersey : World Scientific Pub., [2004]
Series:Selected topics in electronics and systems ; vol. 34.
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .R335 2004
 
Call Number Status Get It
TK7874 .R335 2004 Available