Cover Image

Intrinsic point defects, impurities, and their diffusion in silicon /

Show other versions (1)
Bibliographic Details
Main Author: Pichler, P. (Peter)
Format: Book
Language:English
Published: Wien ; New York : Springer, [2004]
Series:Computational microelectronics.
Subjects:
Silicon crystals > Defects.
Semiconductors > Diffusion.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7871.15.S55 P53 2004
 
Call Number Status Get It
TK7871.15.S55 P53 2004 Available