High-resolution X-ray scattering : from thin films to lateral nanostructures /

Bibliographic Details
Main Author:	Pietsch, Ullrich, 1952-
Other Authors:	Holý, Václav, 1953-, Baumbach, Tilo, 1961-
Format:	Book
Language:	English
Published:	New York : Springer, [2004]
Edition:	2nd ed.
Series:	Advanced texts in physics.
Subjects:	Thin films > Optical properties. X-rays > Scattering. X-rays > Diffraction. Nanostructured materials. Couches minces > Propriétés optiques. Rayons X > Diffusion. Rayons X > Diffraction. Matériaux nanocristallins. Filmes finos.
Online Access:	Publisher description Table of contents only

Description
Physical Description:	xvi, 408 pages : illustrations ; 25 cm.
Bibliography:	Includes bibliographical references (pages [389]-402) and index.
ISBN:	0387400923 (alk. paper) 9780387400921 (alk. paper)