High-resolution X-ray scattering : from thin films to lateral nanostructures /

Bibliographic Details
Main Author:	Pietsch, Ullrich, 1952-
Other Authors:	Holý, Václav, 1953-, Baumbach, Tilo, 1961-
Format:	Book
Language:	English
Published:	New York : Springer, [2004]
Edition:	2nd ed.
Series:	Advanced texts in physics.
Subjects:	Thin films > Optical properties. X-rays > Scattering. X-rays > Diffraction. Nanostructured materials. Couches minces > Propriétés optiques. Rayons X > Diffusion. Rayons X > Diffraction. Matériaux nanocristallins. Filmes finos.
Online Access:	Publisher description Table of contents only

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