Observation-based test set generation /

When circuits are manufactured, there are unavoidable defects that occur in a small but significant portion of the products. Input test patterns that can detect these defects are uniquely generated for each circuit in advance of their production. Current test set generation relies primarily on the &...

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Bibliographic Details

Main Author:	Cobb, Jeffrey Lee, 1982-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2004.
Subjects:	Major electrical engineering.
Online Access:	Link to OAK Trust copy