Stuck-at-fault test set compaction /

Proper testing of manufactured digital circuits is critical to ensuring the number of defective parts is minimized. Automated test pattern generation tools are created in order to produce test patterns that can be applied with the intention of identifying as many defective parts as possible. The inc...

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Bibliographic Details

Main Author:	Vanfickell, Jason Michael
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2004.
Subjects:	Major computer engineering.
Online Access:	Link to OAK Trust copy