Interferometry XII : techniques and analysis : 2-3 August 2004, Denver, Colorado, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Colorado Photonics Industry Association
Other Authors:	Creath, Katherine, Schmit, Joanna
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2004]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5531.
Subjects:	Interferometry > Methodology > Congresses. Measurement > Congresses. Metrology > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/5531.toc

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