Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA /

Bibliographic Details
Corporate Author:	Society of Photo-optical Instrumentation Engineers
Other Authors:	Casasent, D. P. (David Paul), Chao, Tien-Hsin
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2004]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 5437.
Subjects:	Optical pattern recognition > Congresses.

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