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Proceedings : Board and system test track /

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Bibliographic Details
Corporate Authors: International Test Conference Charlotte, N.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : Piscataway, N.J. : International Test Conference ; IEEE, [2003]
Subjects:
Computer storage devices > Testing > Congresses.
Electronic digital computers > Circuits > Testing > Congresses.
Semiconductor storage devices > Congresses.
Description
Item Description:Selection of papers from the proceedings of the conference.
At head of title: ITC International Test Conference 2003.
Conference number inferred.
"IEEE catalog number 03CH37494"--Title page verso.
Physical Description:ii, 216 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780381068