Proceedings : Board and system test track /

Bibliographic Details
Corporate Authors:	International Test Conference Charlotte, N.C., IEEE Computer Society. Test Technology Technical Committee, Institute of Electrical and Electronics Engineers. Philadelphia Section
Format:	Conference Proceeding Book
Language:	English
Published:	Washington, D.C. : Piscataway, N.J. : International Test Conference ; IEEE, [2003]
Subjects:	Computer storage devices > Testing > Congresses. Electronic digital computers > Circuits > Testing > Congresses. Semiconductor storage devices > Congresses.

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