Cover Image

Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A /

Bibliographic Details
Corporate Authors: Materials Research Society. Fall Meeting, Symposium on Fundamentals of Novel/Oxide Semiconductor Interfaces
Other Authors: Abernathy, C. R.
Format: Conference Proceeding Book
Language:English
Published: Warrendale, Pa. : Materials Research Society, [2004]
Series:Materials Research Society symposia proceedings ; v. 786.
Subjects:
Semiconductors > Junctions > Congresses.
Metal oxide semiconductors > Junctions > Congresses.
Dielectric devices > Congresses.
Integrated circuits > Congresses.
Integrated circuits > Materials > Congresses.
Description
Item Description:"This proceedings volume is the record from Symposium E, 'Fundamentals of Novel/Oxide Semiconductor Interfaces, ' held December 1-4 at the 2003 MRS Fall Meeting in Boston, Massachusetts ..."--P. xiii.
Physical Description:xiii, 408 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:1558997245