Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A /

Bibliographic Details
Corporate Authors:	Materials Research Society. Fall Meeting, Symposium on Fundamentals of Novel/Oxide Semiconductor Interfaces
Other Authors:	Abernathy, C. R.
Format:	Conference Proceeding Book
Language:	English
Published:	Warrendale, Pa. : Materials Research Society, [2004]
Series:	Materials Research Society symposia proceedings ; v. 786.
Subjects:	Semiconductors > Junctions > Congresses. Metal oxide semiconductors > Junctions > Congresses. Dielectric devices > Congresses. Integrated circuits > Congresses. Integrated circuits > Materials > Congresses.

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