Testing and testable design of high-density random-access memories /
| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Boston, Mass :
Kluwer Academic,
[1996]
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| Series: | Frontiers in electronic testing ;
6. |
| Subjects: |
| Physical Description: | xxxviii, 386 pages : illustrations ; 25 cm. |
|---|---|
| Bibliography: | Includes bibliographical references (pages [367]-381) and index. |
| ISBN: | 0792397827 (alk. paper) |