Testing and testable design of high-density random-access memories /

Bibliographic Details
Main Author: Mazumder, Pinaki
Other Authors: Chakraborty, Kanad
Format: Book
Language:English
Published: Boston, Mass : Kluwer Academic, [1996]
Series:Frontiers in electronic testing ; 6.
Subjects:
Description
Physical Description:xxxviii, 386 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references (pages [367]-381) and index.
ISBN:0792397827 (alk. paper)