Testing and testable design of high-density random-access memories /

Bibliographic Details
Main Author:	Mazumder, Pinaki
Other Authors:	Chakraborty, Kanad
Format:	Book
Language:	English
Published:	Boston, Mass : Kluwer Academic, [1996]
Series:	Frontiers in electronic testing ; 6.
Subjects:	Random access memory > Testing. Memory (Computers)

Remote Storage