World class reliability : using Multiple Environment Overstress Tests to make it happen /

Bibliographic Details
Main Author: Bhote, Keki R., 1925-2013
Other Authors: Bhote, Adi K.
Format: Book
Language:English
Published: New York : American Management Association, [2004]
Subjects:
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Holdings details from Remote Storage
Call Number: TA169 .B48 2004
 
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TA169 .B48 2004 Available