Estimating the expected latency to failure due to manufacturing defects /

Bibliographic Details

Main Author:	Dorsey, David Michael, 1980-
Other Authors:	Mercer, M. Ray (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Tex.] : [Texas A&M University], [2004]
Subjects:	Major computer engineering. ATPG Testing MTTF ELF-MD ELF MPG-D DO-RE-ME
Online Access:	Link to OAK Trust copy