Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 2003, Providence, Rhode Island, USA /
| Corporate Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2004]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 5265. |
| Subjects: |
| Physical Description: | v, 214 pages : illustrations ; 27 cm. |
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| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819451533 |